Microstructural and Morphological Evolutions in Compositionally-Graded (ba 1−x Sr X )tio 3 Thin Films and Related Dielectric Properties

XH Zhu,HLW Chan,CL Choy,KH Wong
DOI: https://doi.org/10.1080/10584580215343
2002-01-01
Integrated Ferroelectrics
Abstract:Compositionally-graded (Ba1-xSrx)TiO3 (BST) (0.0 less than or equal to x less than or equal to 0.25) thin films consisting of successive layers with increasing Sr/Ba ratios have been layer-by-layer grown on Pt(111)/Ti/SiO2/Si(100) substrates by pulsed-laser deposition. Their microstructural and morphological evolutions with increasing film thickness were investigated by x-ray diffraction (XRD) and scanning electron microscope (SEM). XRD results show that their preferred textures evolve in the sequence of [(100)+(110)]-->(110)-->(100) as the film thickness increases. The corresponding surface grain morphology evolves from compact spherical to elongated, and finally turns to irregular shapes. The related driving force for the orientation development was presumably changed from the minimization of surface energy to the minimization of energy loss per unit area as the film thickness is increased. The measured dielectric properties of the graded films are closely related to the changes of crystallographic orientations, and their relationships are also discussed.
What problem does this paper attempt to address?