Pinning by Planar Defects along the C-Axis in Epitaxial YBa2Cu3O7−δ Thin Films

ZH Wang,KB Li,ZY Chen,H Zhang,XW Cao
DOI: https://doi.org/10.1016/s0921-4534(98)00657-1
1999-01-01
Abstract:We have measured the resistive broadening and the critical current density of an epitaxial YBa2Cu3O7−δ thin film at several fixed magnetic fields as a function of the angle between applied magnetic field and surface of the film. The results show that the angular dependencies of the characteristic temperature T* determined by different reduced resistivity criteria, the effective pinning potential U and the critical current density Jc follow the prediction of the intrinsic pinning model for the angle changing from 0° to 75°, showing the strong planar pinning mechanism. The anomalous peaks of the characteristic temperature T*, the effective pinning potential U and the critical current density Jc were observed near 90°. The twin planes and 2D defects along the c-axis are responsible for the effect of flux line pinning, indicating the pinning by planar defects for H‖c-axis.
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