Application of Moire interferometry for measuring the out-of-plane displacement in ferroelectric ceramics

Chenyang Bai,Zhilun Gui,Longtu Li,Chengsong Fu
1997-01-01
Abstract:The reflective high sensitivity Moire interferometry was applied. A phase-type specimen grating of 1200 lines/mm was replicated on the surface of the ferroelectric ceramics; The Michelson interferometer arrangement, the holographic plate, Moire fringes real-time processing system with CCD and personal computer were adopted to collect and process the Moire fringes. A out-of-plane displacement fields were calculated. Measured results show that the out-of plane displacement gradually increase with the raising of voltage. The interference pattern show the strain of ferroelectric ceramic under the electromagnetic fields.
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