Characterisation of interfacial bonding in Al2O3 coated SiC whisker reinforced TZP composites

Zongtao Zhang,Huibo B. Shan,Yong Huang,Zuozhao Jiang
1996-01-01
British Ceramic Transactions
Abstract:Using X-ray photoelectron spectroscopy, high resolution transmission electron microscopy, and energy dispersive X-ray spectroscopy analysis techniques, the interfacial bonding in Al2O3 coated SiC whisker reinforced tetragonal zirconia polycrystal (TZP) composites was characterised. The results indicated that chemical bonding occurred at SiC/Al2O3 and SiC/TZP interfaces, whereas physical bonding occurred at an Al2O3/TZP interface. No interfacial layers formed between phases and little interdiffusion took place across the interfaces. The lattices of SiC and Al2O3, and SiC and TZP were directly joined at their interfaces. However, two or three dislocation lines were observed at an Al2O3/TZP interface.
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