Studies on the thermal damage mechanisms of a PIN junction optoelectronic diode by laser

Jian L��,Xiaowu Ni,Bikai Luo,Anzhi He
1996-01-01
Abstract:The interaction process of a high-power laser and a PIN junction optoelectronic diode has been studied theoretically and experimentally. It has been put forward that the thermal effect of the laser beam and the eroding and washing effect induced when the laser plasmas expand out result in the damage of the silicon photodiode. The thermal distribution and an expression of the maximum temperature as well as the corresponding experimental results have been obtained when the Q-switched Nd:YAG laser irradiates upon the PIN junction optoelectronic diode.
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