Electrical characterization of YSZ/YSZ-NiO grown by pulsed laser deposition for low temperature solid oxide fuel cells

Wende Liu,Zhenfeng Kang,Qiang Li,Pingping Zheng,Tiezhu Ding
DOI: https://doi.org/10.4028/www.scientific.net/AMR.860-863.807
2014-01-01
Advanced Materials Research
Abstract:This study is focused on the elaboration of 8 mol.% yttria stabilized zirconia (YSZ) thin films onto porous supporting NiO-YSZ anode substrates using pulsed laser deposition (PLD), and their microstructural and electrical characterizations. Better crystallinity and grain connectivity is observed increasing the deposition temperature until best values are obtained at 500 degrees C. The greater relative conductivity enhancement is found at 300-500 degrees C. The observed an increased conductivity at lower temperatures may be caused by a combination of nanoscaled effect of the YSZ thin film and interfacial effects between YSZ thin film and substrate.
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