Abstract:Recent technical advances in scanning transmission electron microscopy (STEM) and xray detector technology have made it possible to perform atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy (EDS) [1]. This ability allows for establishing a direct correlation between atomic-scale STEM images, such as high-angle annular dark-field (HAADF) images, and atomic-scale chemical EDS images, making chemical quantification of interfaces, defects and crystalline structure at the atomic-scale possible. Using these capabilities, we have lately quantified the chemical composition of an epitaxial (La0.7Sr0.3)MnO3 (LSMO)/BiFeO3 (BFO) quantum structure [2], cation occupancy in a Sm-doped SrTiO3 (STO) thin film and antiphase boundaries present within STO films [3], as well as determined structures of several intermetallic alloys [4]. In this study, we describe further use of these capabilities to quantify atomic-scale interdiffusion in self-assembled, vertically aligned nanocomposite (VAN) thin films. Self-assembled VAN thin films, consisting of two immiscible components heteroepitaxially grown on single crystals, have experienced an increase in research activity in recent years [5]. These structures offer the advantage of utilizing the functionalities of both components with the possibility of tuning the material’s properties by tailoring the volume ratio of the two components, the interface-to-volume ratio and hetero-epitaxial strain. In addition, modification of interface properties such as structural and elemental distribution across the interface offers an additional dimension to generate new properties and functionalities. The atomic-scale characterization of the interface plays an essential role in understanding the structure-property relationships. Here we describe the characterization of NiO:LSMO and ZnO:LSMO VAN thin

Dynamic investigation of interface atom migration during heterostructure nanojoining.

In Situ Atomistic Observation of the Deformation Mechanism of Au Nanowires with Twin–twin Intersection

Understanding the Impact of Surface Engineering, Structure, and Design on Electromigration Through Monte Carlo Simulation and In‐Situ SEM Studies

Formation of Metallic Micro/Nanomaterials by Utilizing Migration Phenomena and Techniques for Their Applications

Real-Time Visualization of Solid-Phase Ion Migration Kinetics on Nanowire Monolayer.

Atomistic study of shearing mechanism of nano-Ag joints and processing parameter optimization

Atomic-Scale Investigation of Electromigration with Different Directions of Electron Flow into High-Density Nanotwinned Copper through In Situ HRTEM

Interdiffusion cross-high-entropy alloys, nano-multilayer foils, and Al interface: An atomistic simulation

Atomic Structure and Migration Dynamics of MoS2/LixMoS2 Interface

An in situ elemental migration on a nanosize Cu-Sn interface in a microscope

In Situ Interfacial Manipulation of Metastable States Between Nucleation and Decomposition of Single Bismuth Nanoparticle

Interface Enhancing Strategy for Low-Temperature Bonding of Ag-based Nanoalloy

Atomistic modeling of metal-nonmetal interphase boundary diffusion

Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films

Electrical transport characteristics of atomic contact and nanogap dynamically formed by electromigration

Scanning probe microscopy imaging of metallic nanocontacts

Atomistic simulations of nano-fiber-confined metal plasticity

The Coupling of Local Strain and K + ‐Ion Release Induced Phase Transition Heterogeneity in Tunnel MnO 2

In situ electron microscopy studies of electromechanical behavior in metals at the nanoscale using a novel microdevice-based system

Interfacial Optimization for AlN/Diamond Heterostructures via Machine Learning Potential Molecular Dynamics Investigation of the Mechanical Properties

Thermally Driven Interfacial Dynamics of Metal/Oxide