The stress-affected carrier injection and transport in organic semiconductor devices

Weifeng Dai,Bin Zhang,Yonglong Kang,Huamin Chen,Gaoyu Zhong,Yongtao Li
DOI: https://doi.org/10.1088/0022-3727/46/38/385103
2013-01-01
Abstract:The current-voltage (I-V) characteristics of the thin films of methoxy-5-(2'-ethylhexyloxy)-1,4-phyenylenevinylene] (MEH-PPV) and tris-(8-hydroxyquinoline) aluminum (Alq) under different stresses have been measured, together with their Young's modulus, hardness, and loading curve. We propose a model on stress-affected carrier injection and transport to explain the experimental results. The model is based on the well-built space-charge-limited current (SCLC) and injection-limited current (ILC) model, together with the electrical and mechanic properties of organic semiconductor. By Monte Carlo simulation, we investigated the relationship between the conductance and strain. We found two trends in the current variation with the stress. One is fast at low current density, and the other is relatively slower at high current density, which may due to the SCLC in the bulk and the ILC at the interface, respectively. The working voltage of the present device with the highest sensitivity is about 1 V.
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