Study on I-V and C-V Characteristic of ZnO/p-Si Heterojunction

熊超,袁洪春,徐安成,陈磊,陆兴中,姚若河
2012-01-01
Abstract:In this article,a n-type conductance ZnO thin film was deposited on p-Si film by magnetron sputtering Al-doped ZnO ceramic target,and then ZnO/p-Si heterojunctions were preparated.The photoelectric properties,carrier transport properties and conductive mechanism were studied by testing the I-V and C-V characteristics with and without illumination.The results show that ZnO/p-Si heterojunctions obtain good rectifying properties and photoelectric response,and can be widely used in photoelectric detection and solar cells.As the conduction band and valence band offset in the ZnO/p-Si heterojunction is too big,the current transport mechanism is dominated by the space-charge limited current(SCLC) conduction when the forward voltage exceeds 1 V.And it is also suggested the existence of a large number of interface state in ZnO/p-Si heterojunction,and the photoelectric properties can be further improved by reducing interface states.
What problem does this paper attempt to address?