Scanning Tunneling Microscopy Studies of Topological Insulators Grown by Molecular Beam Epitaxy

Xi Chen,Ke He,Xucun Ma,Qikun Xue
DOI: https://doi.org/10.1051/epjconf/20122300020
2012-01-01
EPJ Web of Conferences
Abstract:We summarize our recent scanning tunneling microscopy (STM) study of topological insulator thin films grown by molecular beam epitaxy (MBE), which includes the observation of electron standing waves on topological insulator surface and the Landau quantization of topological surface states. The work has provided valuable information to the understanding of intriguing properties of topological insulators, as predicted by theory.
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