Analysis And Simulation Of A 4h-Sic Semi-Superjunction Schottky Barrier Diode For Softer Reverse-Recovery

Cao Lin,Pu Hong-Bin,Chen Zhi-Ming,Zang Yuan
DOI: https://doi.org/10.1088/1674-1056/21/1/017303
2012-01-01
Chinese Physics B
Abstract:In this paper, a 4H-SiC semi-superjunction (SJ) Schottky barrier diode is analysed and simulated. The semi-SJ structure has an optimized design and a specific on-resistance lower than that of conventional SJ structures, which can be achieved without increasing the process difficulty. The simulation results show that the specific on-resistance and the softness factor depend on the aspect and thickness ratios, and that by using the semi-SJ structure, specific on-resistance can be reduced without decreasing the softness factor. It is observed that a trade-off exists between the specific on-resistance and the softness of the diode.
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