Electrochemically Deposited Thermoelectric Bismuth-Telluride Films

Yanling Liu,Xiaoxia Yan,Zhigang Zeng,Zhiyu Hu
DOI: https://doi.org/10.4028/www.scientific.net/amr.557-559.1811
2012-01-01
Advanced Materials Research
Abstract:Thermoelectric bismuth-telluride films were successfully prepared from nitric acid aqueous solution with ethylene glycol on Ti-sputtered silicon substrates by electrochemical deposition techniques. Cyclic voltammograms (CV), X-ray diffraction (XRD), scanning electron microscope (SEM) and energy dispersive spectroscopy (EDS) were used to investigate nucleation process, the crystal structures, morphologies and compositions of the bismuth-telluride films. The results show that the materials are Bi-rich, exhibiting preferred (110) orientation with rhombohedral structure. The crystallite size of films was calculated based on Scherrer’s equation and found to be 18-20 nm.
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