X-ray Diffraction of Cu/Ti Fibonacci Superlattices

Zhu Ming,Hu An,Jiang Shusheng,Qui Yan,Feng Duan
DOI: https://doi.org/10.1088/0256-307x/6/10/011
1989-01-01
Chinese Physics Letters
Abstract:1-D quasiperiodic (Fibonacci) Cu/Ti metallic superlattices have been prepared in a dual magnetron sputter deposition system. X-ray scattering measurements of these samples are presented. The x-ray diffraction peaks at low angles can be indexed by the projection method from the high-dimensional periodic structure. In the high angle region, there is one broad peak, which indicates that the samples are amorphous.
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