A simple method for the growth of high-quality GaN nanobelts

Shoubin Xue,Xing Zhang,Ru Huang,Deheng Tian,Huizhao Zhuang,Chengshan Xue
DOI: https://doi.org/10.1016/j.matlet.2008.01.031
IF: 3
2008-01-01
Materials Letters
Abstract:A simple method using two-step growth technology to successfully synthesize the high-quality single crystalline GaN nanobelts was employed in this paper. The as-prepared products are studied by X-ray diffraction (XRD), scanning electron microscopy (SEM) and high-resolution transmission electron microscopy (HRTEM). The results of XRD and the selective area electron diffraction (SAED) patterns indicate that the reflections of the samples can be indexed to the hexagonal GaN phase with single-crystal structure. From the SEM morphology, we can see that the width of the nanobelts is about 800 nm, and the ratio of thickness to width is about 1/10. The maximum length is up to several tens of micrometers. In the HRTEM image, the clear lattice fringes indicate the growth of good-quality hexagonal single-crystal GaN nanobelts. Finally, the growth mechanism is also briefly discussed.
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