Observation on the Interdiffusion in Multilayer Ceramic Capacitors

H Wen,XH Wang,LT Li
DOI: https://doi.org/10.1143/jjap.45.1768
2006-01-01
Abstract:The interface between dielectric layers (BaTiO3) and internal electrode layers (Ni) in X7R type multilayer ceramic capacitors (MLCCs) with an active layer thickness of 5 pin wits studied by scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM). selected-area electron diffraction (SAED) and energy-dispersive spectroscopy (EDS). Weak interdiffusion was observed between dielectric layers and internal electrode layers. It wits found that it was easier for Ni to diffuse into the BaTiO3 perovskite lattice than for BaTiO3 to diffuse into the Ni lattice while neither of the two diffusions extended for a long distance, which was approximately 8 nm on the BaTiO3 side and 3 nm on the Ni side. The mechanic,in of Ni diffusion was also discussed in this study.
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