Abstract:The mechanism of silver interfacial migration was investigated during cofiring multilayer structures of Pb-based relaxor ferroelectric ceramics and Ag/Pd alloy electrode. A several-micron depth of silver diffusion could be confirmed by energy dispersive X-ray spectroscopy measurements. Scanning electron microscopy and transmission electron microscopy observations indicated that the silver migration was not attributed to a single factor. This involved the electrode composition, the sintering characteristic of the ceramics, and the related sintering procedure. All these results have demonstrated that the vapor-phase diffusion via open pores on the surface of the ceramics at the early period of sintering was the most important reason for the silver migration even though the migration along grain boundaries or into grains occurs at the final stage of sintering. Based on an evaporation–condensation vapor-phase mass transport mechanism, a rate-controlled sintering process or a low-temperature sintering route of the materials was suggested to effectively inhibit the interfacial diffusion of silver.

TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors

Interface Cofiring Behaviour of Multilayer Devices Between Ferroelectric and Ag/Pd Electrode

Structural investigations of the co-fired interface of Pb-based relaxor ferroelectrics and Ag–Pd electrode

Relationships between interfacial interaction, electrode formulation and cofiring mismatch of relaxor-based multilayer ceramic devices

Effect of Interactions at the Cofired Interface of Electrode/Ceramics on the Reliability of Lead-Based Multilayer Ceramic Capacitors

Mechanism and Controlling of Silver Migration in Cofired Multilayer Devices with Ag-Pd Inner Electrodes

Interfacial development and microstructural imperfection of multilayer ceramic chips with Ag/Pd electrodes

Interfacial reaction of Ag/Pd metals with Pb-based relaxor ferroelectrics including additives

Characteristics and Effects of Interfacial Interdiffusion in Composite Multilayer Ceramic Capacitors

Vapor Diffusion of Silver in Cofired Silver/palladium–ferroelectric Ceramic Multilayer

Interactions at the Cofired Interface of Ag/Pd Electrode and Lead-Based Ferroelectrics

Effects of Additives on the Interfacial Microstructure of Cofired Electrode‐Ceramic Multilayer Systems

Investigation on the inter-diffusion and microstructure in multilayer ceramic capacitors

Co-firing Behavior of ZnTiO3 Dielectric Ceramics/ag Composites for MLCCs

Study on the Interdiffusion in Base-Metal-electrode MLCCs

Investigation of Ceramic-Metal Interfacial Behavior in Base Metal Electrode MLCC

Influence of silver migration on dielectric properties and reliability of relaxor based MLCCs

Modified cofiring behaviors between PMN-PNN-PZT piezoelectric ceramics and PZT-doped 70Ag–30Pd alloy metallization

Cofiring Behaviors Between BaTiO3-modified Silver–palladium Electrode and Pb-based Relaxor Ferroelectric Ceramics

Sintering characteristics and dielectric properties of silver-doped PMN-PZN-PT relaxor ferroelectric ceramics

Influence of inner electrode on the microstructure of BZN based MLC