Abstract:The mechanism of silver interfacial migration was investigated during cofiring multilayer structures of Pb-based relaxor ferroelectric ceramics and Ag/Pd alloy electrode. A several-micron depth of silver diffusion could be confirmed by energy dispersive X-ray spectroscopy measurements. Scanning electron microscopy and transmission electron microscopy observations indicated that the silver migration was not attributed to a single factor. This involved the electrode composition, the sintering characteristic of the ceramics, and the related sintering procedure. All these results have demonstrated that the vapor-phase diffusion via open pores on the surface of the ceramics at the early period of sintering was the most important reason for the silver migration even though the migration along grain boundaries or into grains occurs at the final stage of sintering. Based on an evaporation–condensation vapor-phase mass transport mechanism, a rate-controlled sintering process or a low-temperature sintering route of the materials was suggested to effectively inhibit the interfacial diffusion of silver.

Vapor Diffusion of Silver in Cofired Silver/palladium–ferroelectric Ceramic Multilayer

Mechanism and Controlling of Silver Migration in Cofired Multilayer Devices with Ag-Pd Inner Electrodes

Interface Cofiring Behaviour of Multilayer Devices Between Ferroelectric and Ag/Pd Electrode

Sintering characteristics and dielectric properties of silver-doped PMN-PZN-PT relaxor ferroelectric ceramics

TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors

Interfacial reaction of Ag/Pd metals with Pb-based relaxor ferroelectrics including additives

Effects of Additives on the Interfacial Microstructure of Cofired Electrode‐Ceramic Multilayer Systems

Characteristics and Effects of Interfacial Interdiffusion in Composite Multilayer Ceramic Capacitors

Interdiffusion Flux and Interface Movement in Metallic Multilayers

Relationships between interfacial interaction, electrode formulation and cofiring mismatch of relaxor-based multilayer ceramic devices

SILVER DIFFUSION MECHANISM OF MULTILAYER COFIRED MICROWAVE DIELECTRIC CERAMIC COMPONENTS

Interactions at the Cofired Interface of Ag/Pd Electrode and Lead-Based Ferroelectrics

Diffusion in Multi-Compositional Pz-Pt-Pzn Ceramics Prepared by Spark Plasma Sintering

Influence of silver migration on dielectric properties and reliability of relaxor based MLCCs

Co-Firing Behavior of Co(2)Z Hexagonal Ferrite/Ag Internal Electrode for Mlcis

Structural investigations of the co-fired interface of Pb-based relaxor ferroelectrics and Ag–Pd electrode

Cofiring Behaviors Between BaTiO3-modified Silver–palladium Electrode and Pb-based Relaxor Ferroelectric Ceramics

Study on Diffusion of Inner Electrode Metals in ZnO-Bi2O3 Based MLCV

Effect of silver dopant on electrical properties of PMN–PNN–PZT piezoelectric ceramics by complex impedance spectroscopy

Effect of Interactions at the Cofired Interface of Electrode/Ceramics on the Reliability of Lead-Based Multilayer Ceramic Capacitors

The Co-Fired Behaviors Between Ag and Glass–ceramics Materials in LTCC