A Sample-Time Error Calibration Technique in Time-Interleaved ADCs with Correlation-Based Detection and Voltage-Controlled Compensation

Yiwen Zhang,Xiaoshi Zhu,Chixiao Chen,Fan Ye,Junyan Ren
DOI: https://doi.org/10.1109/apccas.2012.6418988
2012-01-01
Abstract:Sample-time error between channels degrades the resolution of time-interleaved analog-to-digital converters (TIADCs). A calibration method implemented in mixed circuits with low-complexity and fast-convergence is proposed in this paper. The algorithm for detecting sample-time error is based on correlation and widely applied to wide-sense stationary input signals. The detected sample-time error is corrected by a voltage-controlled sampling switch. Experimental result of the 2-channel 200-MS/s 14-bit TIADC shows that the signal-to-noise-and-distortion ratio improves 19.1 dB, and the spurious-free dynamic range improves 34.6 dB for a 70.12-MHz input after calibration. The convergence time of calibration is about 20000 sampling intervals.
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