Mechanically Engraved Mica Surface Using the Atomic Force Microscope Tip Facilitates Return to a Specific Sample Location.

ZG Liu,Z Li,HL Zhou,G Wei,YH Song,L Wang
DOI: https://doi.org/10.1002/jemt.20158
2005-01-01
Microscopy Research and Technique
Abstract:By controlling the interaction between the atomic force microscope tip and mica, patterns of different sizes and shape have been produced on the surface of mica. Using these operator-constructed patterns as a reliable marker, the original scanned sample location can be re-located and imaged again on the same mica surface by atomic force microscopy (AFM). This location technique can be used to find the same object again even if the sample was removed from the AFM instrument or the sample was imaged in a different mode.
What problem does this paper attempt to address?