In Situ Mechanical Experiments at Atomic Lattice Resolution

韩晓东,张泽

DOI: https://doi.org/10.3969/j.issn.1000-6281.2010.03.001

2010-01-01

Abstract:Since the invention of transmission electron microscopy(TEM) in last century(1932),particularly,the recent two decades,TEM made tremendous progresses in Cs corrected technology for achieving high spatial resolution;in monochromatic electron source for ultra-high energy resolution and fast-CCD camera for timing-resolution.These achievements have contributed enormously to the progresses of the fields of physics,chemistry,biology,materials science,electronics and information science etc.In situ external field technology,as one of the important trends of TEM,has attracted more and more attentions of different research grounds.TEM in situ external field technology provides novel scenarios for physics,chemistry,biology,materials science as well as electronic and information sciences etc.These in situ techniques present important opportunities for developing new mechanisms and novel applications.Directly investigating the structure and its evolution processes at atomic-lattice resolution is the important basis for understanding many mechanisms of physics,chemistry and materials science.In situ deform ation of a nano-object in TEM achieves large angle tilting the specimen along a pair of orthogonal-angled axes for atomic-resolution direct observation.These inventions allow the in situ investigations of the microstructure evolution of the nano-materials with external stress/strain in the atomic-lattice resolution.