Study on Atom-Scale Nanomechanics and Structure under In-Situ/Application Field

张跃飞,郑坤,韩晓东,张泽
2009-01-01
Abstract:Newly-developed methods of in-situ atomic resolution observation of nanowires under bending or tensile strain conducted in a transmission electron microscope have been reviewed.This paper provided a comprehensive review on the methodological development and technical applications of in-situ microscopy,for investigating the structure-mechanical-property relationship of a single one-dimensional nanowire.Details are presented on the direct imaging of brittle to ductile transition and plastic to superplastic behavior of semiconductor nanowires at atomic resolution,providing quantitative information on the mechanical behavior of nanomaterials.The studies on the Si and SiC nanowires clearly demonstrated their distinct,unexpected and superior plastic mechanical properties.Finally,a perspective is given on the future of nanomechanics.
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