Two New Charge Pumps with Improved Reliablity

JIN Rong-hua,LIU Zhi,JIANG Zhou,ZENG Xiao-yang
DOI: https://doi.org/10.15943/j.cnki.fdxb-jns.2008.01.007
2008-01-01
Abstract:The reliability of the voltage-multiplication charge pump circuit is analyzed.Two new structures of the charge pump are proposed.The first one eliminates thenecessity for a high-voltage process but needs using a triple-well process;the second one can be implemented in a standard process.Simulation showed that the circuit performance is in agreement with the theoretical analysis.
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