Effect of Gas Atoms on X-ray Optical Properties of Multilayers

Shimeng Feng,Haiying Zhao,Zhengxiu Fan,Jianda Shao,Xiaoming Dou
DOI: https://doi.org/10.1360/03yg9031
2003-01-01
Abstract:> Multilayers always dissolve some gas atoms during sputtering.In this paper,we developa new method to study the effect of gas atoms on X-ray reflectance of the multilayer.Our theoreti-cal analysis shows that this effect depends not only on the content of gas atom but also on thewavelength and the grazing angle.The shorter the wavelength and the bigger the grazing angle,the stronger this effect of gas atoms.We fabricated Mo/Si multilayers under various sputteringpressures and measured their small angle X-ray diffraction spectra.The measured results coincidewith those calculated by our method.
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