Transmission electron microscopy study of (103)-oriented epitaxial SrBi<sub>2</sub>Nb<sub>2</sub>O<sub>9</sub> films grown on (111) SrTiO<sub>3</sub> and (111) SrRuO<sub>3</sub>/(111) SrTiO<sub>3</sub>

M. A. Zurbuchen,james lettieri,y z jia,D. G. Schlom,S. K. Streiffer,M. E. Hawley
DOI: https://doi.org/10.1557/JMR.2001.0072
IF: 2.7
2001-01-01
Journal of Materials Research
Abstract:Portions of the same epitaxial (103)-oriented SrBi2Nb2O9 film grown on (111) SrTiO3 for which we recently reported the highest remanent polarization (P-r) ever achieved in SrBi2Nb2O9 (or SrBi2Ta2O9) films, i.e., P-r = 15.7 muC/cm(2), have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi2Nb2O9 grows with its c axis tilted 57 degrees from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three [100] SrTiO3 directions. (103) SrBi2Nb2O9 films with and without an underlying epitaxial SrRuO3 bottom electrode have been studied. Dark-field TEM imaging over a 12 mum(2) area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.
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