Preparation and characterization of a-axis oriented NdBa2Cu3O7−δ/PrBa2(Cu,Co)3O7−δ/NdBa2Cu3O7−δ planar junctions

Mutsumi Sato,Gustavo A Alvarez,Furen Wang,Tadashi Utagawa,Keiichi Tanabe,Tadataka Morishita
DOI: https://doi.org/10.1016/S0921-4534(99)00592-4
2000-01-01
Abstract:We report on well characterized a-axis trilayers made of NdBa2Cu3O7-delta and PrBa2(Cu,Co)(3)O7-delta films with smooth surface morphology and high crystallinity. The thin films were grown on (100) SrTiO3 substrates by rf + de hybrid sputtering. X-ray diffraction and Rutherford backscattering spectrometry analyses provided evidence of well-equilibrated and relaxed crystal. Planar junctions were fabricated from these a-axis oriented NdBa2Cu2O7-delta/PrBa2 (Cu,Co)(3)O7-delta/NdBa2Cu3O7-delta trilayers. The current-voltage characteristics exhibited Josephson current. Well developed Shapiro steps for 7-20 GHz microwave irradiation were observed. The dependence of the maximum amplitude of the Josephson current under applied magnetic field made evident spatial variations of the critical current over the PrBa2(Cu,Co)(3)O7-delta barrier layer. The current-voltage characteristics were qualitatively consistent with the resistively-shunted-junction model. (C) 2000 Elsevier Science B.V. All rights reserved.
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