Properties of Y1Ba2Cu3O7−δ and Ba1−XKXBiO3 Step-Edge Grain Boundary Junctions

J Zhou,ZM Ji,XB Wang,L Kang,HB Wang,JY Zhang,SZ Yang,WW Xu,PH Wu
DOI: https://doi.org/10.1016/s0921-4534(97)01300-2
1997-01-01
Abstract:A technique for the fabrication of sharp and straight step-edges on LaAlO3 (LAG) substrates by Ar-ion milling is reported here. Diamond-like carbon (DLC) thin films. deposited by pulsed laser ablation, were used as masks. Clear Shapiro steps were observed in the current-voltage (IV) characteristics of Y1Ba2Cu3O7-delta (YBCO) step-edge junctions with millimeter-wave irradiation. Also, the transport properties of epitaxial Ba1-XKXBiO3 (BKBO) films deposited on LaAlO3 step-edge substrates were studied.
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