Microwave dynamics and electromagnetic properties of YBa2Cu3O7 step-edge junctions on MgO substrates

Y.J. Feng,Y.Q. Shen,J. Mygind,N.F. Pedersen,P.H. Wu
DOI: https://doi.org/10.1016/S0038-1098(97)10003-5
IF: 1.934
1997-01-01
Solid State Communications
Abstract:In this paper, we report the successful fabrication and current-voltage characteristics of the epitaxial c-axis YBa2Cu3O7 step-edge junctions (SEJs) on MgO substrates. The junctions were fabricated by patterning the laser deposited YBa2Cu3O7 thin films on MgO substrates with ion-milled steps. Integer Shapiro steps were observed in the current-voltage characteristics up to 1 THz under 72 GHz external microwave irradiation. Additional subharmonic Shapiro steps have also been found in some junctions with small step height and film thickness ratio, which may be explained by the inhomogeneous YBa2Cu3O7 grain boundary interface formed at the edges of the substrate step. Self-induced electromagnetic resonance (Fiske mode) peaks have been observed in the current-voltage curves of the SEJs with large step height and film thickness ratios. The Swihart velocity and the effective shunting capacitance have been estimated to be 6.9 x 10(6) m s(-1) and 55 fF mu m(-2) at 4.2 K, respectively, from the voltage of the observed Fiske resonance. The shunting capacitance obtained from the electromagnetic resonance compares well with that estimated from the McCumber constant beta(c). (C) 1997 Elsevier Science Ltd.
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