Microstructural Characterization of Fe–N Thin Films

Q Zhan,R Yu,LL He,DX Li
DOI: https://doi.org/10.1016/s0040-6090(02)00289-4
IF: 2.1
2002-01-01
Thin Solid Films
Abstract:The microstructure of Fe–N films with different thicknesses prepared by reactive radio-frequency magnetron sputtering has been investigated by transmission electron microscopy (TEM) and high-resolution transmission electron micrscopy (HREM) in cross-section and plan view. The film showed a small surface roughening at a nanometer scale. Grain clusters were clearly visible in the film. The electron diffraction analysis indicated that the sputtered Fe–N film was polycrystalline with a mixture of α-Fe and α″-Fe16N2 phases. A small amount of Fe2O3 was also observed. The thickness of the film and crystal size may be important factors causing distinct differences in magnetic properties of sputtered Fe–N films.
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