Local Leakage Current Behaviours of BiFeO 3 Films

Zou Cheng,Chen Bin,Zhu Xiao-Jian,Zuo Zheng-Hu,Liu Yi-Wei,Chen Yuan-Fu,Zhan Qing-Feng,Li Run-Wei
DOI: https://doi.org/10.1088/1674-1056/20/11/117701
2011-01-01
Chinese Physics B
Abstract:The leakage current behaviours of polycrystalline BiFeO 3 thin films are investigated by using both conductive atomic force microscopy and current-voltage characteristic measurements.The local charge transport pathways are found to be located mainly at the grain boundaries of the films.The leakage current density can be tuned by changing the post-annealing temperature,the annealing time,the bias voltage and the light illumination,which can be used to improve the performances of the ferroelectric devices based on the BiFeO 3 films.A possible leakage mechanism is proposed to interpret the charge transports in the polycrystalline BiFeO 3 films.
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