Defect-Related Vibrational and Photoluminescence Spectroscopy of A Codoped Zno : Al : N Film

Haiping He,Fei Zhuge,Zhizhen Ye,Liping Zhu,Binghui Zhao,Jingyun Huang
DOI: https://doi.org/10.1088/0022-3727/39/11/004
2006-01-01
Abstract:Fourier transform infrared absorption and photoluminescence (PL) spectroscopy were used to investigate the defects in a codoped ZnO : Al : N film grown on a Si ( 111) substrate. Two broad vibrational modes around 3000 and 3120 cm(-1) were found, which may be attributed to the formation of N-H bonds in different configurations. The room temperature PL spectrum of the ZnO : Al : N film exhibited two dominant emissions centred at 3.04 and 2.77 eV. PL decay and x-ray photoelectron spectroscopy results suggested that the 3.04 eV emission is not likely due to zinc vacancy. We assumed that it might correlate with the N-related defect. The 2.77 eV emission was tentatively assigned to recombination involving an unknown deep localized defect.
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