Spectroscopic Ellipsometry Characterization of Nitrogrn-Doped Vanadium Oxide Films

LI He,GU Deen,WANG Tao,WU Zhiming,JIANG Yadong
DOI: https://doi.org/10.3969/j.issn.1001-2028.2011.06.011
2011-01-01
Abstract:Nitrogen-doped vanadium oxide films were deposited on Si(100) substrates by reactive sputtering.The optical properties of the nitrogen-doped vanadium oxide films were studied with SE850 spectroscopic ellipsometry in the range of 1 300 nm to 2 300 nm(NIR band).The measured ellipsometric spectra of the nitrogen-doped vanadium oxide films were fitted with the Tauc-Lorentz model,and the optical constants(n,k) as well as the thicknesses of the films were calculated.Increases in n,k and decreases in deposition rate of the films are observed with increasing N content.This is correlated to the higher packing density and the narrower optical band gap of the nitrogen-doped vanadium oxide films,resulting from nitrogen incorporation.
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