Luminescence and optical constant of ZnSe/SiO2 composite thin films

Haiqing Jiang,Xi Yao,Jun Che,Minqiang Wang
DOI: https://doi.org/10.7498/aps.55.2084
IF: 0.906
2006-01-01
Acta Physica Sinica
Abstract:The ZnSe/SiO2 composite thin films were prepared by sol-gel process and in-situ growth technique. X-ray diffraction results showed that the phase structure of ZnSe particles embedded in ZnSe/SiO2 composite thin films is the sphalerite (cubic ZnS). X-ray fluorescence results revealed that the molar ratio of Zn/Se is about 1:1.01-1 · 1.19. Scanning electron microscopy results revealed that the size of ZnSe crystal particles is about 400 nm, while some particles are less than 100 nm in size. The dependence of ellipsometric angle Ψ, Δ with wavelength A of ZnSe/SiO2 composite thin films was investigated with spectroscopic ellipsometers. The optical constant, thickness, porosity and the concentration of ZnSe in ZnSe/SiO2 composite thin films were fitted according to Maxwell-Garnett effective medium theory. The photoluminescence properties of ZnSe/SiO2 composite thin films were investigated with fluorescence spectrometer. The photoluminescence results indicated that the emission peak at 487 nm under 395 nm excitation corresponds to the band-to-band emission of sphalerite ZnSe crystal. The strong free exciton emission and other emission peaks correlated with ZnSe lattice defect were also observed.
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