Research of Spatial Resolution in External Electro-Optic Probing

HB Zhang,R Wang,KX Chen,H Yang,DM Zhang,MB Yi
DOI: https://doi.org/10.1016/s0030-3992(02)00009-9
IF: 4.939
2002-01-01
Optics & Laser Technology
Abstract:A new method, based on zero point of longitudinal electric field, was used to determine the spatial resolution of external electro-optic (EO) probing equipment. Considering the diffraction of Gauss beam, the result of external EO probing was simulated which was in accordance with the experiment. A spatial resolution <1μm was demonstrated initially in our equipment using 650nm laser diode as probe beam and semi-insulating GaP as probe tip.
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