Spatial Decoding Electro-Optic Bunch Measurement at Tsinghua Thomson Scattering X-ray Source

Wei Wang,Zhijun Chi,Yingchao Du,Wenhui Huang,Chuanxiang Tang,Lixin Yan,Zhen Zhang
DOI: https://doi.org/10.18429/jacow-ipac2017-mopab077
2017-01-01
Abstract:Electron bunches with duration of sub-picosecond are essential in ultraviolet and X-ray free electron laser (XFEL) to reach the desired peak current. Electro-optic (EO) technique is suitable for temporal profile measurement of these ultrashort bunches which is one of the key diagnostics in FELs. An electro-optic monitor based on spatial sampling has recently been designed and installed for bunch profile diagnostic at Tsinghua Thomson scattering X-ray source (TTX). An ultrashort laser pulse is used to detect the field induced birefringence of the bunch Coulomb field in an electro-optic crystal and the monitor allows direct time-resolved single-shot measurement of bunch profile with an accuracy of 135 femtoseconds for a 40 MeV electron bunch in a non-destructive way, which can simultaneously record the relative time jitter between probe laser and electron bunch. This paper performs the layout of the setup and presents the current measurement results.
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