Effect of SiO_2 Buffer Layers on the Optical and Electrical Properties of Sb-doped SnO_2 Thin Films by Sol-gel Process

CHEN Shuai,ZHAO Xiaoru,DUAN Libing,BAI Xiaojun,LIU Jinming,XIE Haiyan,GUAN Mengmeng
DOI: https://doi.org/10.3969/j.issn.1005-023x.2012.10.008
2012-01-01
Abstract:The Sb-doped SnO2 thin films synthesized by a simple sol-gel method were investigated by means of X-ray diffractometer,visible spectrophotometer and 4-point probes resistivity measurements system.The samples were polycrystalline thin films with rutile structure of undoped SnO2.The results showed that the resistivities of the films decreased at first and then increased with increase of the doping concentration from 1% to 6%,and reached its minimum 8.7×10-3Ω·cm with the doping concentration of 5%.Further analysis indicated that with the increase of the thickness of the buffer layers,the square resistance of the thin films decreased and reached minimum 95Ω/□ and the resistivity reached 1.1×10-3Ω·cm with Sb-doped concentration of 5%.
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