Microstructure transformation of silver nanocrystalline film under nanoindentation

ZANG Peng,ZHANG Yue-fei,LIU Pan,HAN Xiao-dong,ZHANG Ze
DOI: https://doi.org/10.3969/j.issn.1000-6281.2011.06.002
2011-01-01
Abstract:Silver nanocrystalline film with a thickness of 60 nm was deposited on SiO2/Si substrate by DC magnetron sputtering.Nanoindentation tests were performed on the silver film.Atomic Force Microscope was utilized to characterize morphology of the indentation area.The film with the indented area was transferred into Transmission Electron Microscope for further investigation.The results showed that the indented area had a shape of triangle and pile-up was observed along the indentation edge.After the indentation,smaller equi-axial grains of the silver thin film became larger ones whose length direction was perpendicular to the triangle edge.Plenty of deformation twins whose direction was perpendicular to the indentation edge were introduced into the indentation area.
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