Deformation-Induced Transformations of Nanocrystalline Ge-Si Film During Indentation

Xu Z. W.,Ngan A. H. W.,Huang J. G.,Meng X. K.
DOI: https://doi.org/10.1557/proc-0924-z03-05
2006-01-01
Abstract:Thin films of Ge-Si with a duplex nanocrystalline structure were fabricated by magnetron co-sputtering and nanoindentations were made on these films. Transmission electron microscopy and Raman spectroscopy were used to analyze the deformed microstructures in the residual indentations. Amorphization and diamond-cubic (dc) to non-diamond-cubic (non-dc) phase transformation were observed and considered as the major micromechanisms in the deformation of the Ge-Si duplex nanocrystals.
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