Abstract:A clock gate cell with timing error detection and self-correction mechanism was proposed to introduce clock gating technique to error resilient system. Data's late arriving information was obtained through monitoring the voltage change of the inner virtual node, with which the clock network was enabled again and the in-field error correction current cycle when the clock was turned off by mistake was accomplished. Meanwhile, the applicability in different clock gating techniques was discussed with the corresponding error correction strategy. Based on SMIC 40 nm LL library, the cell only required twelve additional transistors compared to the traditional one. The ability of error resilience in wide-voltage operation is verified through the schematic layout; the timing constraints analysis method in the cell integration is given. It is embedded into a commercial C-SKY CK802 processor and the simulation results show that energy efficiency improves by 64.7% compared with traditional design; clock tree power decreases by 32% over current error resilient design.

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