Abstract:For a detailed understanding of fuel retention characterization, especially in-depth profile analysis of plasma facing materials, radio frequency glow discharge optical emission spectroscopy (RF-GDOES) method was applied to determine the deuterium depth concentration. Tungsten or titanium targets were co-deposited in deuterium atmosphere by magnetron sputtering, and these deposited films with different deuterium contents and film thicknesses were used as the standard samples for RF-GDOES measurement. Rutherford backscattering spectroscopy (RBS) and thermal desorption mass spectrometry (TDS) were used to measure the metal and deuterium concentrations in the standard films, respectively. After the standardization of deuterium concentration and sample sputtering rate when tested by RF-GDOES, deuterium concentration and depth profiling of deuterium exposed tungsten samples were obtained and subsequently verified by compared with results by TDS. Results showed the deuterium concentration in deuterium-exposed tungsten has a high concentration peak about 0.002-0.013 at.fr. within 125 nm near-surface, and then reduced by two orders of magnitude from surface to depth with a minimum concentration of few 10(-5)at.fr. With increasing the incident deuterium fluence, deuterium concentration increased obviously in the first 6 mu m near the surface. Under low incident fluence, the total released deuterium amounts obtained from RF-GDOES and TDS methods agree within the experimental error. However, the total released deuterium amounts measured by RF-GDOES were smaller than those of the TDS method under high fluence due to reason of the increasing diffusion depth and inhomogeneity of deuterium in tungsten.

Chemical States and Deuterium Retention Behavior of Vacuum Plasma Sprayed Tungsten Coatings

Blistering Behavior and Deuterium Retention in Tungsten Vanadium Alloys Exposed to Deuterium Plasma in the Linear Plasma Device STEP

Electrodeposition of Tungsten Coatings and Deuterium Irradiation Behavior of Tungsten Coatings

Retention Behavior Of Deuterium And Oxygen In Boronized Vps-W

Deuterium Retention in Tungsten Films Deposited by Magnetron Sputtering

Surface Modification and Deuterium Retention of High Energy Rate Forging W-Y2O3exposed to Deuterium Plasma

Trapping behaviour of deuterium ions implanted into tungsten simultaneously with carbon ions

Surface modification and deuterium retention in hot-rolled potassium doped tungsten alloy exposed to deuterium plasma

Surface Blistering and Deuterium Retention in Chemical Vapor Deposition Tungsten Exposed to Deuterium Plasma

Deuterium Blistering in Tungsten and Tungsten Vanadium Alloys

Effects of Tantalum Alloying on Surface Morphology and Deuterium Retention in Tungsten Exposed to Deuterium Plasma

Deuterium retention in tungsten and tungsten alloys exposed to pure and impurities seeding deuterium plasma

Surface blistering and deuterium retention behaviors in pure and ZrC-doped tungsten exposed to deuterium plasma

Characterization on deuterium retention in tungsten target using spatially resolved laser induced desorption-quadrupole mass spectroscopy

Tungsten Molecular Species in Deuterium Plasmas in Contact with Sputtered W Surfaces

Deuterium Retention in Tungsten-Doped Amorphous Carbon Films Exposed to Deuterium Plasma

Influence of Nitrogen Pre-Irradiation at Different Temperatures on Surface Blistering and Deuterium Retention in Tungsten

Decreased surface blistering and deuterium retention in potassium potassium-doped tungsten exposed to deuterium plasma following ion irradiation

Surface morphology and deuterium retention in tungsten exposed to high flux D plasma at high temperatures

Temperature Dependence of Retention of Energetic Deuterium and Carbon Simultaneously Implanted into Tungsten

Experimental Measurement of Deuterium Concentration and Depth Profiling in Tungsten by Radio Frequency Glow Discharge Optical Emission Spectroscopy