TEM Characterization of Domain Boundaries in a Ti–46Al–1Cr–0.2Si Alloy

GH Cao,GJ Shen,JM Liu,ZG Liu,W Skrotzki
DOI: https://doi.org/10.1016/s1359-6462(03)00410-x
IF: 6.302
2003-01-01
Scripta Materialia
Abstract:The microstructure of a Ti–46Al–1Cr–0.2Si alloy was investigated by transmission electron microscopy (TEM). It is characterized by a duplex structure consisting of a two-phase γ/α2 lamellar microstructure and single-phase γ grains. In the single-phase γ areas there exist 60°, 120° and 180° domain boundaries. In the lamellar structure the γ and α2 phases obey the relationships: (0001)α2//{111}γ with 〈112̄0〉α2//〈110〉γ. The mechanism of formation of the ordered domains is discussed.
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