Research on Fast Recovery Diodes Typed ZK1105/4500

Yong-zhong GUO,Fei-niao WU,Rui-tao WANG,Yu-ling LI
DOI: https://doi.org/10.3969/j.issn.1000-100x.2006.05.046
2006-01-01
Abstract:Fast recovery diodes typed ZK1150-45 with 4500V reverse blocking voltage,1150A forward current and 6μs recovery time are designed and fabricated.In a PIN structure,detail analysis are made to reduce leakage current,volt-age drop,recovery time and to increase blocking voltage and forward current.It is showed that for so high electrical perfor-mance diode,N-substrate parameters must be determined critically.Double-beveled junction termination is studied by a laser beam OBIC(Optical-beam-induced Current) method.Taking influences of interface state between silicon and passi-vation material in count,depletion layer spread and electric field concentration are measured and observed directly.The shortest N-substrate is reached,which makes the best compromise among requirements from different electrical parameters.A special diffusion process for excellent P and N type impurity profile simultaneously has been found and put into production.Re-peated electron irradiations with 12MeV,100μA beam are applied to the chips before housing,and make the carrier life-time being controlled uniformly.In this way,an efficient and reliable process flow with high yield is achieved.
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