Abstract:Ferroelectric materials interact with not only electric fields, but also with mechanical stress/strain through intriguing cross-coupling between ferroelectric polarization and ferroelastic strain. Such mechanical and/or electric multi-field interactions allow symmetry breaking of the rotationally invariant switching field and cause a variety of complicated instability phenomena in ferroelectric systems, e.g., super switching of in-plane ferroelectric nanodomains in strained thin films, labile and ultrafast switching of ferroelastic nanodomains, and ferroelectric polarization reversal via successive ferroelastic transitions. To systematically understand the nature of instabilities in ferroelectrics, here, we propose an analytical method based on Ginzburg-Landau theory to enable rigorous description of any type of instability in arbitrary morphologies and complex microstructures under a finite electric field and/or mechanical loading. The present theory yields, as an instability criterion, the condition that the minimum eigenvalue of the Hessian matrix of potential energy with respect to displacements, electrical potential, and polarization vectors must be zero. In addition, the corresponding eigenvector represents the polarization behavior at the onset of instability, which is successfully validated by application of the criterion to domain switching and successive ferroelastic transitions in PbTiO3 ferroelectric thin film under electrical and mechanical excitation, respectively. This approach thus provides a novel insight into the cause of instability in ferroelectrics. In addition, the proposed criterion is scale-independent, which enables elucidation of the nature of various types of instability in arbitrary ferroelectric systems so that complicated instability issues in practical situations can be addressed.

Stress effects in ferroelectric thin films

Phase Transition Related Stress in Ferroelectric Thin Films

Modification of the phonon thermal conductivity in spatially confined semiconductor nanofilms under stress fields

Domain behavior and polarization changes in ferroelectric films under stress

Stress field effects on phonon properties in spatially confined semiconductor nanostructures

The effect of mechanical strains on the ferroelectric and dielectric properties of a model single crystal ? Phase field simulation

The effect of stress on HfO<sub>2</sub>-based ferroelectric thin films: A review of recent advances

Influence Of Depolarization Field On Polarization States In Epitaxial Ferroelectric Thin Films With Nonequally Biaxial Misfit Strains

Effect of external mechanical stress on the domain structure of Pb(Zr0.35Ti0.65)O3 thin films

Effects of Thickness on the Polarization States in Epitaxial Ferroelectric Thin Films

FIELD-DEPENDENT FERROELECTRIC PROPERTIES OF BLT THIN FILMS UNDER DIFFERENT STRESS

Disentangling stress and strain effects in ferroelectric HfO2

Effect Of Strain And Deadlayer On The Polarization Switching Of Ferroelectric Thin Film

Effects Of Unequally Biaxial Misfit Strains On Polarization Phase Diagrams In Embedded Ferroelectric Thin Layers: Phase Field Simulations

Stress Effects on Ferroelectric and Fatigue Properties of Nd- and La-doped Bi4Ti3O12 Thin Films

Size Effects In Epitaxial Ferroelectric Islands And Thin Films

Instability Criterion for Ferroelectrics under Mechanical/Electric Multi-Fields: Ginzburg-Landau Theory Based Modeling

Coeffect Of Size And Stress In Bi3.25la0.75ti3o12 Thin Films

The contradiction between thermodynamic and kinetic effects of stress-modulated antiferroelectricity in ZrO2 thin films

Mechanical Stress Modified Ferroelectric Aging Behavior