Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils

B. Yang,L.H. Cai,C.K. Ng,C.C. Ling,S. Fung
DOI: https://doi.org/10.1016/j.nimb.2011.04.107
2011-01-01
Abstract:Secondary electron (SE) emission from thin carbon foils induced by 1–20keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5keV or higher, the distribution is found to be characterized by the Sickafus form, AE-m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution.
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