Atomic Structure Of A Thin Silica Film On A Mo(112) Substrate: A Two-Dimensional Network Of Sio4 Tetrahedra

J Weissenrieder,S Kaya,J-L Lu,H-J Gao,S Shaikhutdinov,H-J Freund,M Sierka,T K Todorova,J Sauer
DOI: https://doi.org/10.1103/PhysRevLett.95.076103
IF: 8.6
2005-01-01
Physical Review Letters
Abstract:The structure of a thin single crystalline SiO2 film grown on Mo(112) has been studied by scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. In excellent agreement with the experimental results, density functional theory calculations show that the film consists of a two-dimensional network of corner sharing [SiO4] tetrahedra, with one oxygen of each tetrahedron binding to the protruding Mo atoms of the Mo(112) surface.
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