Abstract:Core- and Valence Photoelectron Spectroscopy (PES), X-ray- and Ultraviolet-Visible Absorption Spectroscopy (XAS and UV-Vis), Scanning Tunneling Microscopy (STM) and Density Functional Theory (DFT) calculations are used to study the electronic and geometrical structure of a class of macro-cyclic molecules, Phthalocyanines (Pc), on surfaces. These molecules are widely studied due to their application in many different fields. Multilayer and monolayer coverages of Iron Phthalocyanine (FePc) and metal-free Phthalocyanine (H2Pc) deposited on different surfaces are investigated in order to get insight in the electronic and geometrical structure of the obtained overlayers, of crucial importance for the understanding of the film functionality. Sublimation of molecular thick films on Si(100) and on conducting glass results in films with molecules mainly oriented with their molecular plane orthogonal to the surface. Ex-situ deposited H2Pc films on conductive glass show different molecular orientation and morphology with respect to the vacuum sublimated films. We study the monolayer adsorption structure of FePc and H2Pc and compare our results with other Pc’s adsorbed on graphite. We find that the molecular unit cell and the superstructure is characteristic for each Pc adsorbed on graphite, even if the geometrical size of the compared molecules is the same. The PE- and XA- spectra of FePc on graphite are essentially identical for the mono- and multilayer preparations, evidencing weak intermolecular and molecular-substrate interactions of van der Waals nature. Furthermore, we characterize Pc’s on InSb (001)-c(8x2). The substrate In rows are observed to be the adsorption site for Pc’s. We find that the growth of the two-dimensional islands of FePc is prolonged in the [-110] direction, in contrast to ZnPc adsorbed on the same substrate at room temperature. We interpret this result as an indication that the adsorption is controlled by the substrate corrugation observed at 70 K.

Structural Properties of Self-Organized Organo-Silicon Macromolecular Films Investigated by Scanning Tunneling Microscopy and X-ray Diffraction

Geometric and Electronic Structures at the Interface Between Iron Phthalocyanine and Si (110)

Morphology and Structures of Self-Assembled Symmetric Poly(di-n-alkylsilanes)

Study of the Edge-on Self-Assembly of Axially Substituted Silicon(IV) Phthalocyanine Derivatives in a Template on the HOPG Surface.

Nano-Machining of Silicon Phthalocyanine Dichloride Films on H-Passivated Si(111)

Blue-green luminescence and SERS study of carbon-rich hydrogenated amorphous silicon carbide films with multiphase structure

A systematic spectroscopic study of the FePc–Si interfaces

X-ray Diffraction Studies of Trilayer Oscillations in the Preferred Thickness of in Films on Si(111)

Thickness-dependent Molecular Chain and Lamellar Crystal Orientation in Ultrathin Poly(di-N-hexylsilane) Films.

The Ordered Thin-Film Growth of Organic Semiconductor on Ag(110).

The Electronic Structure Of Iron Phthalocyanine Probed By Photoelectron And X-Ray Absorption Spectroscopies And Density Functional Theory Calculations

First principles study of electronic structure of x-form phthalocyanine crystals doped with one-dimensional iodine atomic chains

The Electronic Structure of Iron Phthalocyanine Probed by Means of PES, XAS and DFT Calculations

Structural Analysis of Pentacene Thin Film Growth on Polycrystalline O-X-Au Surfaces Using Scanning Tunneling Microscopy

Investigation of the structure-transport correlation in metal phthalocyanine thin films

Effect of annealing on the molecular ordering and crystal structure of Iron Phthalocyanine thin films on Si (111) surface

Crystallized Silicon Nanostructures - Experimental Characterization and Atomistic Simulations

Atomic Structure Of A Thin Silica Film On A Mo(112) Substrate: A Two-Dimensional Network Of Sio4 Tetrahedra

Low-temperature Scanning Tunneling Microscopy Study of Double-Decker DyPc2 on Pb Surface.

Multiphase Structure of Hydrogenated Amorphous Silicon Carbide Thin Films

Internal Atomic Distortion and Layer Roughness of Epitaxial Sic Thin Films Studied by Short Wavelength X-Ray Diffraction