Time-resolved Photoluminescence Spectra of Self-Assembled InAs/GaAs Quantum Dots
LM Kong,JF Cai,ZY Wu,Z Gong,ZC Niu,ZC Feng
DOI: https://doi.org/10.1016/j.tsf.2005.07.079
IF: 2.1
2005-01-01
Thin Solid Films
Abstract:Two types of InAs self-assembled Quantum dots (QDs) were prepared by Molecular beam epitaxy. Atomic force microscopy (AFM) measurements showed that, compared to QDs grown on GaAs substrate, QDs grown on InGaAs layer has a significantly enhanced density. The short spacing (several nanometer) among QDs stimulates strong coupling and leads to a large red-shift of the 1.3 μm photoluminescence (PL) peak. We study systematically the dependence of PL lifetime on the QDs size, density and temperature (T). We found that, below 50 K, the PL lifetime is insensitive to temperature, which is interpreted from the localization effects. As T increases, the PL lifetime increases, which can be explained from the competition between the carrier redistribution and thermal emission at higher temperature. The increase of carriers in QDs migrated from barriers and wetting layer (WL), and the redistribution of carriers among QDs enhance the PL lifetime as T increases. The thermal emission and non-radiative recombination have effects to reduce the PL lifetime at higher T. As a result, the radiative recombination lifetime is determined by the wave function overlapping of electrons and holes in QDs, and QDs with different densities have different PL lifetime dependence on the QDs size.