Study on Electroless Deposition Using Glyoxylic Acid As Reducing Agent for Copper Interconnection

WANG Jing,YANG Zhi-gang,XIE He,JIN Zhe-hui,HU Nan
DOI: https://doi.org/10.3969/j.issn.1001-3660.2006.03.007
2006-01-01
Surface Technology
Abstract:Using glyoxylic acid to replace the harmful chemical substance formaldehyde as a reducing agent,an electroless copper deposition on wafers having TiN as the barrier layers is fulfilled.We fabricated the copper seed layer using NH_4F acid electroless Cu deposition method instead of Pd activation on TiN barrier,followed by the alkaline electroless Cu deposition using Glyoxylic acid as reducing agent to achieve Cu films.The microstructure of cladding is observed by SEM.The effects of plating parameters such as concentration of hydrogen ion,copper ion,glyoxylic acid,EDTA,α,α'-bipyridine,temperature of platingliquid on the alkaline electroless Cu deposition and the optimum condition for ultralarge scale intergation(ULSI)metallization are discussed.The results of present method of electroless Cu deposition can be applied for ULSI metallization.
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