Abstract:La2Zr2O7 (LZO) buffer layers were deposited on bi-axially textured Ni–W substrates with CeO2 seed layer by radio-frequency magnetron sputtering for the large-scale application of YBa2Cu3O7−x (YBCO) coated conductors. The microstructure and surface morphology of LZO buffer layers were studied by X-ray diffraction, optical microscopy, field emission scanning electron microscopy and atomic force microscopy. The influences of substrate temperature and oxygen partial pressure on the microstructure and surface morphology of LZO buffer layers were discussed. It was found that epitaxial LZO films were preferentially c-axis oriented without microcracks, with no degradation of crystallographic texture and with high surface crystallinity. Crack-free and strong c-axis aligned LZO films with no random orientation were obtained at relatively low substrate temperatures of 600–800°C and in flowing 40Pa gas mixtures of Ar–O2 with an effective oxygen partial pressure of 0.1–20Pa. In addition, LZO films grown in low oxygen partial pressure have a smoother surface than films in higher oxygen partial pressure. Then, we fabricated YBCO coated conductors on the high-quality LZO buffer layers by pulsed laser deposition. The critical current density Jc=2.25MA/cm2 and critical current Ic=180A/cm of 0.8-μm-thick YBCO film at 77K, self field were obtained. The magnetic field and angular dependences of critical current per width were discussed. Highly textured LZO films grown on CeO2 seed layer were suitable as a buffer layer for the growth of YBCO coated conductors with high currents.

The influences of rapid growth of yttria-stabilized ZrO_2 buffer layers for YBCO coated conductors

Fabrication and Characterization of Y2O3 Stabilized ZrO2 Films Deposited with Aerosol-Assisted MOCVD

Formation and Rate Processes of Y2o3 Stabilized Zro2 Thin Films from Zr(Dpm)(4) and Y(Dpm)(3) by Cold-Wall Aerosol-Assisted Mocvd

Deposition of Y2O3 stabilized ZrO2 thin films from Zr(DPM)4 and Y(DPM)3 by aerosol-assisted MOCVD

Formation and Rate Processes of Y[sub 2]o[sub 3] Stabilized ZrO[sub 2] Thin Films from Zr(DPM)[sub 4] and Y(DPM)[sub 3] by Cold-Wall Aerosol-Assisted MOCVD

Texture and Morphology Developments of Yttria-stabilized Zirconia (YSZ) Buffer Layer for Coated Conductors by RF Sputtering

Characterisation of YSZ Layers Deposited on Y2O3 Buffered Textured Tapes for Coated Conductors

Reel-To-Reel Deposition of Epitaxial Double-Sided Y2o3 Buffer Layers for Coated Conductors

Epitaxial growth of YSZ buffer layer for YBa2Cu3O7-δ coated conductor by reel to reel pulsed laser deposition

Preparation and Characterization of Ceo2/Ysz/Ceo2 Buffer Layers for Ybco Coated Conductors

Fabrication of YBCO Coated Conductors on Biaxial Textured Metal Substrate by All-Sputtering

Improvement of Surface Morphology of Yttrium-Stabilized Zirconia Films Deposited by Pulsed Laser Deposition on Rolling Assisted Biaxially Textured Substrate Tapes

Metal Organic Deposition of Lanthanum Zirconate Buffer Layer on Biaxially Textured Ni-5%W Substrate

Improved Textured La2Zr2O7 Buffer Layers on Bi-Axially Textured Ni–W Substrates Using CeO2 Seed Layers for YBa2Cu3O7−x Coated Conductors

Fabrication and Characterization of La2Zr2O7 Films on Different Buffer Architectures for YBa2Cu3O7−δ Coated Conductors by RF Magnetron Sputtering

Influence of O2 Pressure on the Structure and Surface Morphology of YSZ Layer for YBCO Coated Conductor Deposited by PLD on Ni-W Tape

Reel-To-Reel Continuous Deposition Of Ce(X)Zr(1-X)O(2) Single Buffer Layer For Ybco Coated Conductors

Tailoring the Crystallographic Orientation of MOD-derived La2Zr2O7 Buffer Layers for Coated Conductors

Single Cerium Zirconate Buffer Layer on Biaxially Textured Metal Substrates for High Performance Coated Conductors

Effects of YSZ Buffer Layer Surface Morphology on Superconducting Performance of YBCO Films Deposited by Pulsed Laser Deposition on NiW Tapes

The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors