Influence of Strain on the Band Gap Energy of Wurtzite InN

P. Schley,R. Goldhahn,G. Gobsch,M. Feneberg,K. Thonke,X. Wang,A. Yoshikawa
DOI: https://doi.org/10.1002/pssb.200880924
2009-01-01
physica status solidi (b)
Abstract:Degenerate wurtzite InN films with electron concentrations in the range of 10(18) cm(3) were studied by using spectroscopic ellipsometry (SF) in two spectral ranges . The analysis of the frequencies of the coupled phono-plasmon modes in the mid-infrared region allows the determination of the plasma frequency and thus of the carrier density in the bulk of the samples SE from the near-infrared to the invisible range provides the dielectric function (DF) around the absorption edge. The electron concentraion as an important input parameter enables accurate determination of Burstein-Moss shift and band-gap renormalization for the analysis of the imaginary part of the DF. Taking into account the in-plane strain of the films, which is caused by lattice mismatch between InN and buffer/substrate we obtain a zero density strain-free band gap of 0.675 eV at room temperature.
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