ADC Dynamic Parameter Test Based on Time-Frequency Calculation

黄庆,华云,杨中海
IF: 1.992
2008-01-01
Microelectronics Journal
Abstract:To solve problems with conventional methods for testing ADC dynamic parameters,such as windows and coherent sampling,which are not accurate enough or hard to realize,a novel technique called coherent-after-sampling was presented,which can suppress spectral leakage effectively.To prevent picket-fence effect,a novel technique based on signal recovery was proposed to calculate signal power in time-domain and noise power in frequency -domain,respectively.An example was given to demonstrate the effectiveness of the proposed technique, which has high precision and is easy to implement.
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